XRD, FTIR And Electrical Properties Investigation Of Ni0.6 Zn0.4 Crx Fe2- X O4 Thin Films

Abstract

Nanoparticles of Ni0.6 Zn0.4 Crx Fe 2-x O4 were prepared and characterized to understand their structural XRD,
FTIR and electrical properties such as dc resistivity as a function of temperature. The dielectric constant (ε`)
and dielectric loss (tanδ) are also studies as a function of frequency and temperature. It observes the value
of dielectric constant is beginning arises for x = 0.2 and 0.4 at 530ko and for x = 0.6 at 510ko
. Loss coefficient
is decreases with increased frequency in all the thin film samples except x = 0.4 . Surface morphology and
particle orientation have been investigated by TEM and SEM images. It have scientific and technological
importance in recent years due to their magnetic properties and wide range of applications especially when
the size of the particles approaches to nanometer scale. They have been used for high-frequency
transformer cores, rod antennas, and radio-frequency coils. More recently, these are also used in nanoelectronic devices, high-speed integrated circuits as well as in biomedical field as contrasting agents used
for magnetic resonance imaging (MRI). Spinel ferrites are materials with good magnetic and electronic
properties, which depend strongly on the cation distribution among the tetrahedral and octahedral sites.